TESTING SERVICE ITEMS

Test Classification Test content Equipment used
Inorganic component analysis Emission spectrum Qualitative, semi-quantitative and quantitative analysis of elements in inorganic materials Inductively coupled plasma optical emission spectrometer (ICP-OES);
Inductively coupled plasma optical emission spectrometer-mass spectrometer (ICP-MS);
X-ray fluorescence spectrometer (XRF);
Spark direct reading spectroscopy;
Glow discharge optical emission spectrometer (GD-OES)
Absorption spectrum Analysis of major and trace elements Atomic Absorption Spectrometer (AAS)
Gas element analysis Quantitative analysis of oxygen and nitrogen in metal materials and ceramics O, N analyzer;
C, S analyzer
Structural analysis Metallographic structure analysis “High and low magnification microstructure inspection and evaluation;
Grain size rating;
Non-metallic inclusion content determination;
Determination of decarburized layer/carburized hardened layer depth”		 Metallographic microscope
X-ray diffraction analysis “Phase qualitative analysis;
Phase quantitative analysis;
Unit cell parameters;
Nanomaterial microstructure (grain size/microstress);
Rietveld structure refinement;
High temperature in situ diffraction (HTXRD);
Low temperature in situ diffraction (LTXRD);
Texture analysis;
High resolution diffraction (HRXRD);
Grazing incidence diffraction (GID);
Total reflection (XRR);
Micro-area diffraction, etc.”		 X-ray powder diffractometer (XRD);
High resolution X-ray diffractometer
(HR-XRD-1, HD-XRD-2);
Two-dimensional detector X-ray diffractometer
Transmission electron microscopy analysis Powder morphology analysis;
EDS element qualitative and semi-quantitative analysis;
STEM+HAADF imaging;
Ultra-thin slice preparation and morphology analysis;
High-resolution lattice image;
Selected area electron diffraction		 Transmission electron microscope (TEM);
TEM sample preparation equipment
Probe analysis “Surface morphology;
Surface three-dimensional morphology;
EDS element qualitative and semi-quantitative analysis;
Element surface distribution and line scanning;
Micro-phase analysis;
Grain orientation and pole figure analysis;
Luminescence characteristics of semiconductor materials;
Defect analysis of some inorganic non-metallic materials”		 Scanning electron microscope (SEM); Scanning probe microscope (SPM); Laser scanning confocal microscope
X-ray Photoelectron Spectroscopy Qualitative and quantitative analysis of elements and chemical states on the material surface (depth less than 10nm);
Analysis of work function and valence band on the film surface;
Analysis of film angle resolution or ion etching depth		 X-ray Photoelectron Spectroscopy (XPS)
Organic Analysis Chromatography Separation and quantitative analysis of organic matter High Performance Liquid Chromatography (HPLC)
Mass spectrometry Qualitative and quantitative analysis of trace organic matter “Liquid chromatography triple quadrupole mass spectrometry (LC-MS-MS);
Gas chromatography mass spectrometry (GC-MS);”
Spectrum Identification and identification of organic matter Infrared spectrometer (IR);
Micro-infrared;
Ultraviolet-visible spectrophotometer (UV);
Raman spectrometer (Raman)
NMR Organic structure analysis (hydrogen spectrum, carbon spectrum, fluorine spectrum, phosphorus spectrum, etc.) Nuclear Magnetic Resonance Spectrometer (NMR)
Element Determination of C, H, N, S, O content in organic compounds, polymer materials, drugs, petroleum products and other materials. Organic element analyzer
Physical performance analysis Mechanical properties  “Compressive strength;
Flexural strength;
Shear strength;
Tensile strength;
Rockwell hardness;
Vickers hardness;
Microhardness;
Elastic modulus”		 Universal material testing machine;
Microhardness tester
Thermal properties “Material decomposition temperature;
Glass transition temperature;
Thermal weight loss;
Phase change temperature and phase change enthalpy (melting point, crystallization, phase transition);
Reaction temperature and reaction enthalpy;
Dynamic mechanical properties test (storage modulus, loss modulus);
Specific heat capacity test;
Material thermal conductivity test (thermal conductivity, thermal diffusion coefficient)”		 “Thermogravimetric/differential thermal analyzer (TG-DTA);
Laser thermal conductivity analyzer (LFA);
Physical property measurement system (PPMS)”
Electrical properties “Resistivity;
Hall coefficient;
Critical current;
Anisotropic magnetoresistance;
Material micro-area conductivity test;
Material surface electric domain observation”		 Comprehensive physical property measurement system (PPMS);
Scanning probe microscope (SPM)
Optical performance “Total reflectivity;
Diffuse reflectivity;
Cut-off wavelength;
Transmittance;
Material fluorescence properties;
Phosphorescence lifetime”		 Ultraviolet-visible spectrophotometer (UV);
Fluorescence spectrometer;
Quantum efficiency test system
Magnetic properties “Magnetic hysteresis loop;
Thermomagnetic curve;
Saturation magnetization;
Remanence;
Coercive force;
Curie temperature;
AC magnetic susceptibility;
Magnetic domain observation, etc.”		 Comprehensive physical property measurement system (PPMS);
Magnetic performance test system (MPMS);
Scanning probe microscope (SPM)
Particle size and specific surface area analysis Particle size distribution;
Zeta potential;
Specific surface area, pore size distribution and porosity test of micro-, meso- and macroporous materials		 Micron particle size analyzer;
Nano particle size analyzer;
Specific surface area tester (BET);
Mercury intrusion tester
Density Density value; true density Mercury Porosimeter
Catalyst performance test Relevant physical properties of catalysts, catalyst supports and various other materials;
Metal surface area;
Surface acidity, distribution and strength of active sites		 Chemical adsorption instrument
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